Title:
IMAGING METHOD, FOCUS POSITION ADJUSTMENT METHOD, AND MICROSCOPE SYSTEM
Document Type and Number:
WIPO Patent Application WO/2023/053540
Kind Code:
A1
Abstract:
An imaging method for capturing an image of a sample in a microscope system comprises: a step (step S4) for, on the basis of a plurality of captured images obtained by capturing images of the sample while changing the relative position of the focus of a light receiving optical system to the sample, determining a plurality of relative positions that serve as candidates; a step (step S6) for determining a relative position for performing imaging from among the plurality of relative positions that serve as the candidates; and a step (step S10) for performing imaging on the sample at the determined relative position.
More Like This:
| JP2003329560 | IMAGING UNIT FOR VICKERS HARDNESS TESTING MACHINE |
| WO/2015/068360 | MICROSCOPE SYSTEM AND AUTOFOCUSING METHOD |
Inventors:
MURAKAMI KOHEI (JP)
Application Number:
PCT/JP2022/015946
Publication Date:
April 06, 2023
Filing Date:
March 30, 2022
Export Citation:
Assignee:
SYSMEX CORP (JP)
International Classes:
G02B21/36; G02B7/28; G02B7/36; C12M1/00; C12M1/34
Foreign References:
| JP2016206228A | 2016-12-08 | |||
| JP2015227940A | 2015-12-17 | |||
| JP2013142769A | 2013-07-22 | |||
| JP2015166829A | 2015-09-24 | |||
| JP2013131862A | 2013-07-04 | |||
| JPH06186469A | 1994-07-08 |
Attorney, Agent or Firm:
SHIBANO, Masanori et al. (JP)
Download PDF:
Previous Patent: AIRBAG DEVICE AND METHOD FOR DEPLOYING AIRBAG DEVICE
Next Patent: FRAUD DETECTION SYSTEM, FRAUD DETECTION METHOD, AND PROGRAM
Next Patent: FRAUD DETECTION SYSTEM, FRAUD DETECTION METHOD, AND PROGRAM