IMPULSE IMMUNITY EVALUATING DEVICE

WIPO Patent Application WO/2008/108503

A1

According to the application method based on the related art, it is impossible to apply a rectangular wave having a rapid rise to an electronic circuit with a sufficient voltage. Moreover, the electrostatic discharge test can perform application with a sufficient voltage but only an oscillating waveform can be applied. A TLP generation device is used for a rectangular wave generation device. "Resistance to be applied + matching resistance" are set so as to match with the characteristic impedance of a transmission path which transmits the rectangular wave to an evaluation object. By making a connection with a return line of the applied rectangular wave by a capacitor, it is possible to perform stable application. Immunity is the applied voltage at which an erroneous operation monitor function of the electronic circuit firstly detects an erroneous operation while gradually increasing the wave height value of the rectangular wave.

TSUKAGOSHI TSUNEO (JP)
WATANABE TAKESHI (JP)
NAKAIE TOSHIYUKI (JP)
MATSUI NOBUCHIKA (JP)

PCT/JP2008/054558

September 12, 2008

March 06, 2008

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NEC CORP (JP)
NEC ELECTRONICS CORP (JP)
HANWA ELECTRONIC IND CO LTD (JP)
TSUKAGOSHI TSUNEO (JP)
WATANABE TAKESHI (JP)
NAKAIE TOSHIYUKI (JP)
MATSUI NOBUCHIKA (JP)

G01R31/30

JP2004309153A	2004-11-04
JP3613269B2	2005-01-26
JP2000329818A	2000-11-30
JP3613269B2	2005-01-26
JP2006038542A	2006-02-09
JP2007055153A	2007-03-08

See also references of EP 2120059A4

IKEDA, Noriyasu et al. (4-10 Nishishinbashi 1-chome, Minato-k, Tokyo 03, JP)

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