Title:
INCREMENTAL DEVICE FAULT DIAGNOSIS METHOD
Document Type and Number:
WIPO Patent Application WO/2024/060381
Kind Code:
A1
Abstract:
An incremental device fault diagnosis method, using a trained fault diagnosis model to process data to be diagnosed having a new sample influx, to obtain a fault diagnosis result of a device. A construction method for the fault diagnosis model comprises: 1) constructing a complete sample set; 2) constructing an initial fault diagnosis model, and training the initial fault diagnosis model by using the complete sample set; 3) selectively retaining important sample subsets by using a sample retention method; 4) during the new sample influx, constructing an intermediate fault diagnosis model on the basis of the structure and parameters of the initial fault diagnosis model; and 5) on the basis of a knowledge distillation algorithm, jointly training the intermediate fault diagnosis model by using a new sample set and the important sample subsets, and obtaining and testing a final fault diagnosis model. The present invention realizes effective learning of new samples and retention of old samples, so that not only is the capability to determine new fault types achieved, but also good memory capability is kept for historical samples.
Inventors:
QIAO FEI (CN)
GUAN LIUEN (CN)
GUAN LIUEN (CN)
Application Number:
PCT/CN2022/131657
Publication Date:
March 28, 2024
Filing Date:
November 14, 2022
Export Citation:
Assignee:
UNIV TONGJI (CN)
International Classes:
G05B23/02; G06N3/12
Foreign References:
| CN114429153A | 2022-05-03 | |||
| CN113741394A | 2021-12-03 | |||
| CN110162018A | 2019-08-23 | |||
| CN113205142A | 2021-08-03 | |||
| CN110866365A | 2020-03-06 | |||
| US20200175384A1 | 2020-06-04 |
Attorney, Agent or Firm:
SHANGHAI KESHENG INTELLECTUAL PROPERTY AGENCY LTD. (CN)
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