Title:
INFORMATION PROCESSING DEVICE, OBJECT MEASUREMENT SYSTEM, OBJECT MEASUREMENT METHOD, AND PROGRAM STORAGE MEDIUM
Document Type and Number:
WIPO Patent Application WO/2019/172363
Kind Code:
A1
Abstract:
In order to improve the certainty of a measurement value obtained by measuring the length, etc., of an object to be measured, on the basis of a photographed image, an information processing device 60 is provided with a detection unit 61 and a calculation unit 62. The detection unit 61 detects, as a measurement use point, a portion that is used for prescribed length measurement of the object, in each of sectioned regions, in an object image included in the photographed image including the photographed object to be measured, set on both sides with respect to a reference line which is set for the object image and by which the object image is sectioned. The calculation unit 62 calculates the length of a segment, in each of the sectioned regions, between the measurement use point and the intersection point between the reference line and a perpendicular line passing through the measurement use point and being perpendicular to the reference line. Further, the calculation unit 62 calculates a length, in the object, to be measured, by adding together the lengths of the segments calculated in the respective divided regions of the object to be measured.
Inventors:
KITAGAWA TAKEHARU (JP)
PIAO JUN (JP)
PIAO JUN (JP)
Application Number:
PCT/JP2019/009045
Publication Date:
September 12, 2019
Filing Date:
March 07, 2019
Export Citation:
Assignee:
NEC CORP (JP)
International Classes:
G01B11/04; G06T7/60
Domestic Patent References:
| WO2016092646A1 | 2016-06-16 | |||
| WO2017204660A1 | 2017-11-30 |
Foreign References:
| JP2000215319A | 2000-08-04 |
Attorney, Agent or Firm:
SHIMOSAKA Naoki (JP)
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