Title:
INFORMATION STORAGE DEVICE AND DEFECT DETECTING CIRCUIT
Document Type and Number:
WIPO Patent Application WO/2003/032308
Kind Code:
A1
Abstract:
Small−scale highly precise defect detecting means for eliminating a defective section properly during recording and for improving the reproducibility during reproducing. The defect detecting means is characterized by detection a defect, if any, by using an intensity signal representing the intensity of reflected light reflected by an information storage medium, in the region where information is recorded by a magnet−optical recording method.
Inventors:
KOBAYASHI MANABU (JP)
NARUMI TOSHIKATSU (JP)
NARUMI TOSHIKATSU (JP)
Application Number:
PCT/JP2001/006974
Publication Date:
April 17, 2003
Filing Date:
August 13, 2001
Export Citation:
Assignee:
FUJITSU LTD (JP)
KOBAYASHI MANABU (JP)
NARUMI TOSHIKATSU (JP)
KOBAYASHI MANABU (JP)
NARUMI TOSHIKATSU (JP)
International Classes:
G11B20/18; G11B7/00; (IPC1-7): G11B11/105; G11B7/004; G11B20/18
Foreign References:
| JP2000268430A | 2000-09-29 | |||
| JPH06338144A | 1994-12-06 | |||
| JPH06302040A | 1994-10-28 | |||
| JPH04105824U | 1992-09-11 |
Attorney, Agent or Firm:
Yamada, Masaki (Pelican Building 4th Floor 3-3,
Nishi-shimbashi 3-chom, Minato-ku Tokyo, JP)
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