Title:
INSPECTION ASSISTANCE DEVICE, PRODUCTION MANAGEMENT SYSTEM, AND INSPECTION ASSISTANCE METHOD
Document Type and Number:
WIPO Patent Application WO/2023/181346
Kind Code:
A1
Abstract:
This inspection assistance device comprises: an image acquisition unit that acquires image data by capturing images of an upper surface and a back surface of a component in a supply step in which a component supply unit supplies the component to a component mounting machine in a pickable manner; a component analysis unit that, on the basis of the image data, determines the positional relationship of a feature portion on the back surface of the component with respect to the exterior of the component on the upper surface side thereof on the basis of the image data, and causes the positional relationship to be stored as feature portion information; and a storage unit in which mounting information, indicating a substrate on which the component picked by the component mounting machine has been mounted and the mounting position of the component on the substrate, is stored in association with the feature portion information in such a manner as to be readable by an inspection device that performs exterior inspection of the substrate having the component mounted thereon.
Inventors:
ASAOKA KENTO (JP)
Application Number:
PCT/JP2022/014381
Publication Date:
September 28, 2023
Filing Date:
March 25, 2022
Export Citation:
Assignee:
FUJI CORP (JP)
International Classes:
H01L21/50; H01L21/60; H05K13/02
Domestic Patent References:
| WO2019097675A1 | 2019-05-23 |
Foreign References:
| JPH11274240A | 1999-10-08 | |||
| JP2016171107A | 2016-09-23 | |||
| JPH08335609A | 1996-12-17 | |||
| JPH11163047A | 1999-06-18 |
Attorney, Agent or Firm:
KYORITSU INTERNATIONAL (JP)
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