INSPECTION ASSISTANCE SYSTEM, INSPECTION ASSISTANCE METHOD, AND INSPECTION ASSISTANCE PROGRAM

WIPO Patent Application WO/2023/188671

A1

An inspection assistance system according to the present invention comprises a shape recognition unit, a defect detection unit, a coordinate transformation parameter estimation unit, a 3D CAD model modification unit, a 2D simulated image extraction unit, and a depiction unit. The shape recognition unit recognizes the shape of an inspection target on the basis of a 2D actual image captured by an imaging device. The defect detection unit detects defects, of the inspection target, included in the 2D actual image. On the basis of the recognized shape and the 3D CAD model, the coordinate transformation parameter estimation unit estimates a coordinate transformation parameter for transforming a first coordinate system corresponding to the 3D CAD model into a second coordinate system corresponding to the viewpoint of the imaging device that captured the 2D actual image. The 3D CAD model modification unit uses the coordinate transformation parameter to modify the position and direction of viewpoint information of the 3D CAD model. The 2D simulated image extraction unit extracts a 2D simulated image from the 3D CAD model after the viewpoint information has been modified. The depiction unit depicts a defect image on the 3D CAD model by matching the 2D actual image including the defect image to the 2D simulated image.

ISHII SHOTA (JP)
SAKAI TATSUYA (JP)
TANAKA MAKOTO (JP)

PCT/JP2023/000032

October 05, 2023

January 05, 2023

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MITSUBISHI HEAVY IND LTD (JP)
MITSUBISHI POWER LTD (JP)

G01N21/88; G06T7/00; G06T7/70

JP2021021669A	2021-02-18
JP2021530051A	2021-11-04
US20210183102A1	2021-06-17

SSIP PATENT ATTORNEY CORPORATION (JP)

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