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Title:
INSPECTION DEVICE AND METHOD FOR MICRO LIGHT-EMITTING DIODE
Document Type and Number:
WIPO Patent Application WO/2021/068539
Kind Code:
A1
Abstract:
An inspection device and method for a micro light-emitting diode (20). The inspection device is used for inspecting the micro light-emitting diode (20) provided on an original substrate (10). The bottom part of the micro light-emitting diode (20) away from the original substrate (10) comprises an electrode area and a non-electrode area (23). The electrode area is provided with a first contact (21) and a second contract (22). The inspection device comprises: an inspection substrate (30) and an inspection circuit. A bonding layer (40) is provided on the inspection substrate (30). The bonding layer (40) is used for bonding with the original substrate (10) during a test. The inspection circuit comprises an electrode set provided on the bonding layer (40). The electrode set comprises a first electrode (50) and a second electrode (60). The first electrode (50) is used for contacting the first contact (21) of the micro light-emitting diode (20) during the test. The second electrode (60) is used for contacting the second contact (22) of the micro light-emitting diode (20) during the test. The inspection device and method for the micro light-emitting diode (20) reduce the difficulty of repairing a micro light-emitting diode display.

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Inventors:
XIA JIYE (CN)
Application Number:
PCT/CN2020/095334
Publication Date:
April 15, 2021
Filing Date:
June 10, 2020
Export Citation:
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Assignee:
CHENGDU VISTAR OPTOELECTRONICS CO LTD (CN)
International Classes:
G01R31/26; H01L21/66
Foreign References:
CN108428638A2018-08-21
CN201408245Y2010-02-17
CN110265348A2019-09-20
CN208795818U2019-04-26
CN109377922A2019-02-22
US20170296819A12017-10-19
Attorney, Agent or Firm:
LEADER PATENT & TRADEMARK FIRM (CN)
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