Title:
INSPECTION DEVICE, INSPECTION METHOD, PROGRAM, AND RECORDING MEDIUM
Document Type and Number:
WIPO Patent Application WO2010109858
Kind Code:
A1
Abstract:
The disclosed inspection device (1) acquires an inspection image (60) by imaging a front polarizing sheet (10), a liquid crystal panel (20) which is the inspection target, a rear polarizing sheet (30), and a backlight (40), from the side of the front polarizing sheet (10), and inspects the liquid crystal panel (20) using information on viewing angle characteristics for detecting the inspection image (60) and defects with high precision. The inspection device (1) acquires a first image by imaging the front polarizing sheet (10), a liquid crystal panel used as a benchmark (20'), the rear polarizing sheet (30), and the backlight (40), from the side of the front polarizing sheet (10), and also acquires a second image by imaging the front polarizing sheet (10) and the backlight (40), from the side of the front polarizing sheet, and the abovementioned information on viewing angle characteristics is generated based on the first image and the second image. As a result, disclosed is a defect inspection technique for liquid crystal panels which can detect defects caused by contaminants with high precision.
Inventors:
UEKI SHOTA
UEDA YASUHIRO
YAMAMOTO SHUHHEI
UEDA YASUHIRO
YAMAMOTO SHUHHEI
Application Number:
PCT/JP2010/002078
Publication Date:
September 30, 2010
Filing Date:
March 24, 2010
Export Citation:
Assignee:
SHARP KK (JP)
UEKI SHOTA
UEDA YASUHIRO
YAMAMOTO SHUHHEI
UEKI SHOTA
UEDA YASUHIRO
YAMAMOTO SHUHHEI
International Classes:
G01M11/00; G01B11/00; G01N21/956; G02F1/13
Foreign References:
| JP2007108286A | 2007-04-26 | |||
| JP2006215211A | 2006-08-17 | |||
| JP2000081368A | 2000-03-21 |
Attorney, Agent or Firm:
HARAKENZO WORLD PATENT & TRADEMARK (JP)
Patent business corporation Hara [Kenzo] international patent firm (JP)
Patent business corporation Hara [Kenzo] international patent firm (JP)
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