Title:
INSPECTION DEVICE AND INSPECTION METHOD USING FUNCTIONAL LIGHT SOURCE, AND FUNCTIONAL LIGHT SOURCE AND DESIGN METHOD THEREFOR
Document Type and Number:
WIPO Patent Application WO/2012/153695
Kind Code:
A1
Abstract:
An inspection device (30) using a functional light source (31), characterized in comprising: an RGB camera (32), which is a measurement device capable of measuring reflected light and outputting measurement values thereof; a functional light source (31) that uses the color white as the color of the light source by selecting a narrowband light source having three or more mutually different peak wavelengths, controlling the conditions of lights emitted by the narrowband light source, and mixing the lights; and an assessment unit (33) for acquiring measurement values of a plurality of portions under inspection when the light reflected from the portions under inspection are measured by the RGB camera (32) while the portions are illuminated by the functional light source (31), and assessing the inspection results on the basis of the measurement values.
Inventors:
NAKAUCHI SHIGEKI (JP)
NISHINO KEN (JP)
HIMENO TOHRU (JP)
NISHINO KEN (JP)
HIMENO TOHRU (JP)
Application Number:
PCT/JP2012/061612
Publication Date:
November 15, 2012
Filing Date:
May 02, 2012
Export Citation:
Assignee:
NAT UNIV CORP TOYOHASHI UNIV (JP)
NAKAUCHI SHIGEKI (JP)
NISHINO KEN (JP)
HIMENO TOHRU (JP)
NAKAUCHI SHIGEKI (JP)
NISHINO KEN (JP)
HIMENO TOHRU (JP)
International Classes:
G01N21/84; F21S2/00
Domestic Patent References:
| WO2007094338A1 | 2007-08-23 |
Foreign References:
| JP2002048733A | 2002-02-15 | |||
| JP2006133052A | 2006-05-25 | |||
| JP2008151613A | 2008-07-03 | |||
| JP2003126066A | 2003-05-07 | |||
| JP2008046103A | 2008-02-28 | |||
| JP2012078197A | 2012-04-19 | |||
| JP2012083282A | 2012-04-26 |
Attorney, Agent or Firm:
IIDA, Akio et al. (JP)
Akio Iida (JP)
Akio Iida (JP)
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Claims: