Title:
INSPECTION DEVICE AND METHOD
Document Type and Number:
WIPO Patent Application WO/2020/189189
Kind Code:
A1
Abstract:
This inspection device comprises: an image-capturing unit which obtains an evaluation workpiece image that is captured with a plurality of predetermined illumination light emission patterns in order to obtain an optimized illumination light emission pattern with which the influence of non-defective product variations of a workpiece can be suppressed while defects in a workpiece are emphasized; an image area setting unit which sets a plurality of image areas associated with a plurality of different labels; an optimization calculation unit which generates a first index of which the output value increases as a difference between an image area associated with a non-defective label and an image area associated with a defective label increases, and a second index of which the output value increases as a difference or contrast between the image areas associated with the non-defective label increases, and calculates an illumination light emission pattern for inspection such that the first index becomes larger and the second index becomes smaller; and a determination unit which performs image processing on an inspection workpiece image captured with the illumination light emission pattern for inspection, and determines a pass/fail label of a workpiece to be inspected.
More Like This:
Inventors:
NARUSE YOSUKE (JP)
Application Number:
PCT/JP2020/007451
Publication Date:
September 24, 2020
Filing Date:
February 25, 2020
Export Citation:
Assignee:
OMRON TATEISI ELECTRONICS CO (JP)
International Classes:
G01N21/84; G01N21/88; G06T7/00
Foreign References:
| JP2019035609A | 2019-03-07 | |||
| JP2004294358A | 2004-10-21 | |||
| JP2018189558A | 2018-11-29 | |||
| JP2002197448A | 2002-07-12 | |||
| EP2887055A1 | 2015-06-24 | |||
| JP2019048163A | 2019-03-28 | |||
| EP2887055A1 | 2015-06-24 | |||
| JP2018031747A | 2018-03-01 |
Other References:
See also references of EP 3940373A4
Attorney, Agent or Firm:
INABA, Yoshiyuki et al. (JP)
Download PDF: