Title:
INSPECTION DEVICE AND INSPECTION METHOD
Document Type and Number:
WIPO Patent Application WO/2023/162140
Kind Code:
A1
Abstract:
This inspection device comprises an acquisition unit and a determination unit. The acquisition unit acquires a first image and a second image. The first image is obtained by subjecting an image to binarization processing by using a first threshold whereby it is possible to identify, in an image in which the tip end part of a tubular member through which a fluid can flow is imaged from a direction along the flow direction of the fluid, the tip end part of the tubular member and a hole section through which the fluid can flow and which is in a region formed within the tip end part of the tubular member. The second image is obtained by subjecting an image to binarization processing by using a second threshold whereby it is possible to identify a hole section in the image and a deposit adhered to the hole section. The determination unit determines whether the hole section is clogged by the deposit on the basis of a differential image of the first image and the second image acquired by the acquisition unit.
More Like This:
| JPH10163687 | COMPONENT MOUNTING METHOD |
Inventors:
SUZUKI MIKIYA (JP)
KOTANI KAZUYA (JP)
INAURA YUKI (JP)
KOTANI KAZUYA (JP)
INAURA YUKI (JP)
Application Number:
PCT/JP2022/007890
Publication Date:
August 31, 2023
Filing Date:
February 25, 2022
Export Citation:
Assignee:
FUJI CORP (JP)
International Classes:
H05K13/08; H05K13/04
Foreign References:
| JP2012112688A | 2012-06-14 | |||
| JPH1197894A | 1999-04-09 | |||
| JP2014183163A | 2014-09-29 |
Attorney, Agent or Firm:
KYORITSU INTERNATIONAL (JP)
Download PDF: