Title:
INSPECTION DEVICE, PACKAGING MACHINE, AND PACKAGE INSPECTION METHOD
Document Type and Number:
WIPO Patent Application WO/2020/230446
Kind Code:
A1
Abstract:
Provided are an inspection device, packaging machine, and package inspection method that make it possible to, for example, enhance inspection accuracy. An X-ray inspection device (45) comprises an X-ray irradiation device (51) for irradiating a conveyed PTP film (25) with X-rays and an X-ray line sensor camera (53) for imaging the PTP film (25) irradiated with the X-rays. The coordinate system of an X-ray transmission image acquired by the X-ray line sensor camera (53) is converted to the coordinate system of the PTP film (25) on the basis of the positional relationship between the X-ray irradiation device (51), PTP film (25), and X-ray line sensor camera (53), and the PTP film (25) is inspected on the basis of the X-ray transmission image that has had the coordinate system thereof converted.
Inventors:
OHTANI TAKAMASA (JP)
OHYAMA TSUYOSHI (JP)
SAKAIDA NORIHIKO (JP)
OHYAMA TSUYOSHI (JP)
SAKAIDA NORIHIKO (JP)
Application Number:
PCT/JP2020/011757
Publication Date:
November 19, 2020
Filing Date:
March 17, 2020
Export Citation:
Assignee:
CKD CORP (JP)
International Classes:
G01N23/04; G01N23/16; G01N23/18
Foreign References:
JP2013253832A | 2013-12-19 | |||
JP2014085190A | 2014-05-12 | |||
JP2016024096A | 2016-02-08 | |||
JP2011033505A | 2011-02-17 | |||
JP2012225666A | 2012-11-15 | |||
JP2011149738A | 2011-08-04 | |||
JPH0743320A | 1995-02-14 | |||
US20120207272A1 | 2012-08-16 |
Attorney, Agent or Firm:
KAWAGUCHI Mitsuo (JP)
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