Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
INSPECTION DEVICE, PACKAGING MACHINE, AND PACKAGE INSPECTION METHOD
Document Type and Number:
WIPO Patent Application WO/2020/230446
Kind Code:
A1
Abstract:
Provided are an inspection device, packaging machine, and package inspection method that make it possible to, for example, enhance inspection accuracy. An X-ray inspection device (45) comprises an X-ray irradiation device (51) for irradiating a conveyed PTP film (25) with X-rays and an X-ray line sensor camera (53) for imaging the PTP film (25) irradiated with the X-rays. The coordinate system of an X-ray transmission image acquired by the X-ray line sensor camera (53) is converted to the coordinate system of the PTP film (25) on the basis of the positional relationship between the X-ray irradiation device (51), PTP film (25), and X-ray line sensor camera (53), and the PTP film (25) is inspected on the basis of the X-ray transmission image that has had the coordinate system thereof converted.

Inventors:
OHTANI TAKAMASA (JP)
OHYAMA TSUYOSHI (JP)
SAKAIDA NORIHIKO (JP)
Application Number:
PCT/JP2020/011757
Publication Date:
November 19, 2020
Filing Date:
March 17, 2020
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
CKD CORP (JP)
International Classes:
G01N23/04; G01N23/16; G01N23/18
Foreign References:
JP2013253832A2013-12-19
JP2014085190A2014-05-12
JP2016024096A2016-02-08
JP2011033505A2011-02-17
JP2012225666A2012-11-15
JP2011149738A2011-08-04
JPH0743320A1995-02-14
US20120207272A12012-08-16
Attorney, Agent or Firm:
KAWAGUCHI Mitsuo (JP)
Download PDF: