Title:
INSPECTION MANAGEMENT SYSTEM, INSPECTION MANAGEMENT DEVICE, INSPECTION MANAGEMENT METHOD, AND PROGRAM
Document Type and Number:
WIPO Patent Application WO/2022/157995
Kind Code:
A1
Abstract:
In a product manufacturing line having a plurality of steps and a plurality of manufacturing devices and inspection devices corresponding to the plurality of steps, this inspection management system manages a final inspection for performing inspection of a finished product having passed through the plurality of steps and intermediate inspections performed in advance of the final inspection. The inspection management system has: an inspection detail data acquisition means; an inspection result information acquisition means; and an inspection detail setting assistance means that generates and displays, as information relating to inspection items of one of the intermediate inspections, an inspection result diagram, which indicates presence or absence of a product determined to be defective in the final inspection, as well as information which enables identification of whether or not the product determined to be defective in the final inspection was determined to be defective in the inspection items in any of the other intermediate inspections.
Inventors:
MORI HIROYUKI (JP)
TANAKA MAYUKO (JP)
TANAKA MAYUKO (JP)
Application Number:
PCT/JP2021/009048
Publication Date:
July 28, 2022
Filing Date:
March 08, 2021
Export Citation:
Assignee:
OMRON TATEISI ELECTRONICS CO (JP)
International Classes:
G05B19/418; G01N21/956; G01N23/083; H05K3/34; H05K13/00; H05K13/08
Foreign References:
| JP2019125693A | 2019-07-25 |
Attorney, Agent or Firm:
IP FIRM SHUWA (JP)
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