Title:
INSPECTION MANAGEMENT SYSTEM AND INSPECTION MANAGEMENT DEVICE
Document Type and Number:
WIPO Patent Application WO/2023/189220
Kind Code:
A1
Abstract:
An inspection management system for managing inspection contents of an inspection device that is provided in a production line for a component mounting board, the inspection management system comprising: a component inspection restriction design storage means that stores component inspection restriction design information; an inspection program creation means that creates an inspection program defining, for each component that is mounted to the component mounting board, an inspection item for detecting the defect defined in the component inspection restriction design information related to the component, and an inspection device that implements an inspection related to the inspection item; and an image display means that displays an inspection coverage setting confirmation image.
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Inventors:
KONDA RYUICHIRO (JP)
Application Number:
PCT/JP2023/008178
Publication Date:
October 05, 2023
Filing Date:
March 03, 2023
Export Citation:
Assignee:
OMRON TATEISI ELECTRONICS CO (JP)
International Classes:
H05K3/34; H05K13/08
Domestic Patent References:
| WO2015115432A1 | 2015-08-06 |
Foreign References:
| JP2012151250A | 2012-08-09 | |||
| JP2019125694A | 2019-07-25 | |||
| JP2008032525A | 2008-02-14 |
Attorney, Agent or Firm:
IP FIRM SHUWA (JP)
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