Title:
INSPECTION SYSTEM, INSPECTION MANAGEMENT DEVICE, INSPECTION PROGRAM CREATING METHOD, AND PROGRAM
Document Type and Number:
WIPO Patent Application WO/2022/196083
Kind Code:
A1
Abstract:
An inspection system comprising: (1 + n) types of imaging means that image a component mounting board that is to be inspected, thereby acquiring image data; (1 + m) types of inspection means that, on the basis of the (1 + n) types of image data acquired by the respective ones of the (1 + n) types of imaging means, implement inspections associated with the respective pieces of image data; an inspection appropriateness level calculating means that calculates, for each of a plurality of inspection items related to components mounted on the component mounting board, an inspection appropriateness level indicating the appropriateness of the respective one of the (1 + m) types of inspections by the (1 + m) types of inspection means with respect to detection of abnormality according to the inspection items; and an inspection program creating means that, on the basis of the inspection appropriateness level, determines, for each of the inspection items related to the components mounted on the component mounting board, whether or not to implement the respective one of the (1 + m) types of inspections.
Inventors:
ONISHI TAKAKO (JP)
Application Number:
PCT/JP2022/001723
Publication Date:
September 22, 2022
Filing Date:
January 19, 2022
Export Citation:
Assignee:
OMRON TATEISI ELECTRONICS CO (JP)
International Classes:
H05K13/08; G01N21/956
Domestic Patent References:
| WO2015122272A1 | 2015-08-20 | |||
| WO2019155593A1 | 2019-08-15 | |||
| WO2012096004A1 | 2012-07-19 |
Foreign References:
| JP2012151250A | 2012-08-09 |
Attorney, Agent or Firm:
IP FIRM SHUWA (JP)
Download PDF:
Previous Patent: INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND PROGRAM
Next Patent: COMMUNICATION SYSTEM
Next Patent: COMMUNICATION SYSTEM