Title:
INSPECTION SYSTEM, AND SPOT LIGHTING DEVICE FOR INSPECTION
Document Type and Number:
WIPO Patent Application WO/2023/106113
Kind Code:
A1
Abstract:
This inspection system comprises a spot lighting device for inspection, provided with a light source body and a light emitting surface for emitting light emerging from the light source body as inspection light, and an imaging device including an object-side telecentric optical system for imaging a workpiece, the inspection system being configured such that the inspection light emitted from the light emitting surface is shone onto the workpiece coaxially with an optical axis of the imaging device, wherein the light source body is configured using a semiconductor laser.
Inventors:
KOYAMA TAKAHIKO (JP)
YOSHIMURA NORIHISA (JP)
YOSHIMURA NORIHISA (JP)
Application Number:
PCT/JP2022/043415
Publication Date:
June 15, 2023
Filing Date:
November 24, 2022
Export Citation:
Assignee:
CCS INC (JP)
International Classes:
G01N21/84; F21S2/00; F21V9/30; G01N21/88; F21Y115/30
Foreign References:
| JP2017142346A | 2017-08-17 | |||
| JP2018040914A | 2018-03-15 | |||
| CN206671745U | 2017-11-24 | |||
| US8588267B1 | 2013-11-19 | |||
| JP2002341246A | 2002-11-27 | |||
| JP2021085815A | 2021-06-03 |
Other References:
KURAMOTO KYOSUKE, TAKEHIRO NISHIDA, SHINJI ABE: "High Power 638nm Red Laser Diode for Display Applications", MITSUBISHI DENKI GIHO, vol. 89, no. 5, 1 May 2015 (2015-05-01), pages 47 - 50, XP093069116
Attorney, Agent or Firm:
NISHIMURA, Ryuhei et al. (JP)
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