Title:
INTEGRATED CIRCUIT ANALOG-TO-DIGITAL CONVERSION CHIP PARAMETER TESTING METHOD AND TESTING SYSTEM
Document Type and Number:
WIPO Patent Application WO/2023/226117
Kind Code:
A1
Abstract:
An integrated circuit analog-to-digital conversion chip parameter testing method and testing system. The testing method comprises the steps of: 1. performing weighted shift addition on an output signal x(n) of an ADC by using a double-convolution window function, so as to obtain an intercepted signal y(m), wherein the double-convolution window function is obtained by means of performing two instances of self-convolution and two-end zero padding on a Hanning window with the length of M; and 2. performing spectral analysis on the intercepted signal y(m), and calculating dynamic parameters of the ADC. When spectrum leakage is generated due to the frequency precision of an input sinusoidal signal source provided for an ADC to be tested not being high, the method can effectively recover the spectrum of the input sinusoidal signal source during coherent sampling.
Inventors:
MA GUOJUN (CN)
LI MINGZE (CN)
ZHU QINHUA (CN)
ZHANG YIFAN (CN)
LI MINGZE (CN)
ZHU QINHUA (CN)
ZHANG YIFAN (CN)
Application Number:
PCT/CN2022/099702
Publication Date:
November 30, 2023
Filing Date:
June 20, 2022
Export Citation:
Assignee:
UNIV JIANGSU SCIENCE & TECH (CN)
JIANGYIN EASYCHIP ELEC TECH CO LTD (CN)
JIANGYIN EASYCHIP ELEC TECH CO LTD (CN)
International Classes:
G01R31/28; G01R23/16
Foreign References:
| CN107294533A | 2017-10-24 | |||
| CN111984920A | 2020-11-24 | |||
| CN105911341A | 2016-08-31 | |||
| CN101388001A | 2009-03-18 | |||
| CN103457603A | 2013-12-18 | |||
| CN103441762A | 2013-12-11 | |||
| CN105717359A | 2016-06-29 | |||
| CN103308766A | 2013-09-18 | |||
| JPH06181433A | 1994-06-28 | |||
| US20150323640A1 | 2015-11-12 |
Attorney, Agent or Firm:
NANJING SUGAO PATENT AND TRADEMARK FIRM(ORDINARY PARTNERSHIP) (CN)
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