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Patent Searching and Data


Title:
LADDER DIAGRAM-BASED PLC INSTRUCTION QUALITY DETECTION METHOD, AND TERMINAL
Document Type and Number:
WIPO Patent Application WO/2022/141745
Kind Code:
A1
Abstract:
Disclosed are a ladder diagram-based programmable logic controller (PLC) instruction quality detection method, and a terminal. In the present invention, the method comprises: reading a PLC instruction to be tested in a test case, to acquire a program file path of a PLC, writing the PLC instruction to be tested into the PLC to obtain a PLC program; turning on a ladder diagram, the ladder diagram executing the PLC program according to preset test data in the test case, comparing an execution result with a theoretical result in the preset test data to obtain a test result, and writing the test result into a test result field of the corresponding instruction in the test case; and repetitively executing the steps S1 and S2 until all the PLC instructions to be tested in the test case are tested, and generating a test report according to the test case and outputting same. In the present invention, a PLC instruction set is tested by means of a ladder diagram, without the need for manual intervention, improving the test efficiency; and the quality of the PLC instruction test can be ensured.

Inventors:
LAI YONGZHEN (CN)
OU XINMU (CN)
HUANG JIBO (CN)
TAO YANJIE (CN)
Application Number:
PCT/CN2021/075377
Publication Date:
July 07, 2022
Filing Date:
February 05, 2021
Export Citation:
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Assignee:
FUZHOU FU CHANG WECON ELECTRONICS TECH CO LTD (CN)
International Classes:
G06F11/36
Foreign References:
CN102541045A2012-07-04
CN109783368A2019-05-21
CN108335718A2018-07-27
CN109144857A2019-01-04
CN110737573A2020-01-31
Attorney, Agent or Firm:
BORSAM INTELLECTUAL PROPERTY(FUZHOU) (CN)
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