Title:
LASER ANALYZING DEVICE AND METHOD
Document Type and Number:
WIPO Patent Application WO/2005/074003
Kind Code:
A1
Abstract:
Irradiation means irradiates the surface (13) of a specimen with a femtosecond laser beam (LB) in a low fluence range corresponding to the material of the surface of the specimen to cause nonthermal desorption ionization in the surface (13) of the specimen when the surface (13) of the specimen is irradiated with the laser beam. Analyzing means (2) analyzes molecular ions (M+) desorbed from the surface of the specimen by the applied femtosecond laser beam by means of, for example, time-of-flight mass spectrometry.
Inventors:
SHIMIZU SEIJI (JP)
SAKABE SHUJI (JP)
HASHIDA MASAKI (JP)
KATO UTAKO (JP)
KURIHARA TATSUO (JP)
UMEDA MASATO (JP)
ESAKI NOBUYOSHI (JP)
SAKABE SHUJI (JP)
HASHIDA MASAKI (JP)
KATO UTAKO (JP)
KURIHARA TATSUO (JP)
UMEDA MASATO (JP)
ESAKI NOBUYOSHI (JP)
Application Number:
PCT/JP2005/001019
Publication Date:
August 11, 2005
Filing Date:
January 26, 2005
Export Citation:
Assignee:
UNIV KYOTO (JP)
SHIMIZU SEIJI (JP)
SAKABE SHUJI (JP)
HASHIDA MASAKI (JP)
KATO UTAKO (JP)
KURIHARA TATSUO (JP)
UMEDA MASATO (JP)
ESAKI NOBUYOSHI (JP)
SHIMIZU SEIJI (JP)
SAKABE SHUJI (JP)
HASHIDA MASAKI (JP)
KATO UTAKO (JP)
KURIHARA TATSUO (JP)
UMEDA MASATO (JP)
ESAKI NOBUYOSHI (JP)
International Classes:
G01N27/64; H01J49/16; H01J49/40; (IPC1-7): H01J49/16; G01N27/64; H01J49/40
Domestic Patent References:
| WO2002068952A1 | 2002-09-06 |
Foreign References:
| JP2003510776A | 2003-03-18 |
Attorney, Agent or Firm:
Egami, Tatsuo c/o Tokyo, Central Patent Firm (4th Floor Oak Building Kyobashi, 16-10,
Kyobashi 1-chome, Chuou-k, Tokyo 31, JP)
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