Title:
LEARNING DEVICE, INFERENCE DEVICE, PROGRAM, LEARNING METHOD, AND INFERENCE METHOD
Document Type and Number:
WIPO Patent Application WO/2021/240589
Kind Code:
A1
Abstract:
The present invention comprises: a deterioration processing unit (101) that performs a first image process for simulating deterioration of an image on a sample image, thereby generating a deterioration sample image; an image processing unit (102) that uses a process parameter to perform a preset second image process on the deterioration sample image, thereby generating a processed image; and a model generation unit (104) that uses the sample image and the processed image to perform training, thereby generating a trained model for inferring an appropriate process parameter for the second image process.
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Inventors:
FUJITA TAKEO (JP)
SUZUKI DAISUKE (JP)
SUZUKI DAISUKE (JP)
Application Number:
PCT/JP2020/020503
Publication Date:
December 02, 2021
Filing Date:
May 25, 2020
Export Citation:
Assignee:
MITSUBISHI ELECTRIC CORP (JP)
International Classes:
G06T7/00; G06N3/08; G06N20/00
Foreign References:
| JP2018206382A | 2018-12-27 |
Other References:
KALANTARI ET AL.: "A Machine Learning Approach for Filtering Monte Carlo Noise", ACM TRANSACTIONS ON GRAPHICS, vol. 34, no. 122, 2015, XP055683712, Retrieved from the Internet DOI: 10.1145/2766977
Attorney, Agent or Firm:
YAMAGATA Yoichi et al. (JP)
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