LEARNING DEVICE, LEARNING METHOD, ABNORMALITY DETECTION DEVICE, ABNORMALITY DETECTION METHOD, AND COMPUTER-READABLE RECORDING MEDIUM

Title:

LEARNING DEVICE, LEARNING METHOD, ABNORMALITY DETECTION DEVICE, ABNORMALITY DETECTION METHOD, AND COMPUTER-READABLE RECORDING MEDIUM

Document Type and Number:

WIPO Patent Application WO/2022/130460

Kind Code:

A1

Abstract:

A learning device 10 includes a learning unit 11 which learns a first parameter and a second parameter included in a mapping model for mapping a feature vector that is generated on the basis of normal data input as training data to a region that is set on the basis of a preset subspace and distance from the subspace, said first parameter being for generating the feature vector and said second parameter being for adjusting the distance.

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Inventors:

MITANI SHOHEI (JP)
YOSHINAGA NAOKI (JP)

Application Number:

PCT/JP2020/046553

Publication Date:

June 23, 2022

Filing Date:

December 14, 2020

Export Citation:

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Assignee:

NEC CORP (JP)

International Classes:

G06N20/00

Foreign References:

JP2002190025A	2002-07-05
JP2016049055A	2016-04-11
JP2018049355A	2018-03-29

Other References:

CHALAPATHY, RAGHAVENDRA ET AL.: "Anomaly Detection using One-Class Neural Networks", ARXIV, 11 January 2019 (2019-01-11), XP055945722, Retrieved from the Internet [retrieved on 20210309]

Attorney, Agent or Firm:

BRIGHTAS IP ATTORNEYS (JP)

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