LIGHT BEAM MEASUREMENT DEVICE, LASER DEVICE AND LIGHT BEAM SEPARATION DEVICE

WIPO Patent Application WO/2014/208754

A1

A light beam measurement device is provided with: a polarimeter which includes a first measurement unit beam splitter which is placed upon an optical path of laser light, and which measures the polarization state of partially reflected laser light in the first measurement unit beam splitter; a beam profile meter which includes a second measurement unit beam splitter which is placed upon the optical path of the laser light, and which measures the beam profile of the partially reflected laser light in the second measurement unit beam splitter; and a laser beam travel direction stability meter which measures stability of the laser beam travel direction for the laser light. The first measurement unit beam splitter and the second measurement unit beam splitter may be formed of material including CaF2.

JP2959902	[Title of Invention] A semiconductor laser, an apparatus having the same, and a method for manufacturing the same.
JPS5826407	[Title of the Invention] How to improve the iron disadvantage characteristic of an electromagnetic plate and sheet
JPH10113781	LASER BEAM MACHINING METHOD

MORIYA MASATO (JP)
WAKABAYASHI OSAMU (JP)
WATABE YOSHINOBU (JP)

PCT/JP2014/067270

December 31, 2014

June 27, 2014

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GIGAPHOTON INC (JP)

H01S3/00; H01S3/134

WO2009125745A1	2009-10-15
WO2001055684A2	2001-08-02
WO2005033625A1	2005-04-14

JP2007214189A	2007-08-23
JPH11201869A	1999-07-30
JP2002048911A	2002-02-15
JP2008055436A	2008-03-13
US4081760A	1978-03-28
JP2009081363A	2009-04-16
JP2006179600A	2006-07-06
US20020118721A1	2002-08-29

EBISU International Patent Office (JP)
Patent business corporation エビス international patent firm (JP)

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