LIGHT SOURCE FREQUENCY DETECTION CIRCUIT FOR IMAGE SENSOR

TECHNICAL FIELD

[0001] This disclosure relates generally to electronic circuits, and in particular but not exclusively, relates to a light source frequency detection circuit to compensate for light source flicker.

BACKGROUND INFORMATION

[0002] Light source flicker is the repetitious fading, pulsing, or flickering of a light source due to the alternating current ("AC") frequency of the power driving the light source. Two power source frequencies predominate throughout the developed world — 60 Hz (predominant in North America) and 50 Hz (predominant in Europe).

[0003] Modern imaging devices (e.g., still cameras or video cameras) often use pixel arrays (e.g., CCD arrays or CMOS arrays) to capture images. When capturing images illuminated by a flickering light source using modern pixel arrays, the rate of flickering can affect the quality of the image captured. The pixel arrays may be calibrated or tuned to compensate for one of the predominant power source frequencies. Such calibration may include synchronized image acquisition, auto-gain compensation, exposure time, or otherwise. As such, imaging devices may be designed for a particular regional market (e.g., Europe, North America) to automatically compensate for a particular power frequency (e.g., 50 Hz or 60 Hz). Some electronic device may even include complicated and expensive circuitry to analyze the acquired image data to determine the light source power frequency.

BRIEF DESCRIPTION OF THE DRAWINGS

[0004] Non-limiting and non-exhaustive embodiments of the invention are described with reference to the following figures, wherein like reference numerals refer to like parts throughout the various views unless otherwise specified.

[0005] FIG. 1 is a functional block diagram illustrating an imaging system, in accordance with an embodiment of the invention.

[0006] FIG. 2 is a functional block diagram illustrating a light source frequency

detection circuit, in accordance with an embodiment of the invention.

[0007] FIG. 3 is a flow chart illustrating operation of a modulation circuit of a light source frequency detection circuit, in accordance with an embodiment of the invention.

[0008] FIG. 4 is a flow chart illustrating operation of a logic unit of a light source frequency detection circuit, in accordance with an embodiment of the invention.

[0009] FIG. 5A is a graph illustrating sampling blocks of a modulation signal corresponding to a 50 Hz light source, in accordance with an embodiment of the invention.

[0010] FIG. 5B is a graph illustrating sampling blocks of a modulation signal corresponding to a 60 Hz light source, in accordance with an embodiment of the invention.

DETAILED DESCRIPTION

[0011] Embodiments of an apparatus and technique for light source power frequency detection are described herein. In the following description numerous specific details are set forth to provide a thorough understanding of the embodiments. One skilled in the relevant art will recognize, however, that the techniques described herein can be practiced without one or more of the specific details, or with other methods, components, materials, etc. In other instances, well-known structures, materials, or operations are not shown or described in detail to avoid obscuring certain aspects.

[0012] Reference throughout this specification to "one embodiment" or "an embodiment" means that a particular feature, structure, or characteristic described in connection with the embodiment is included in at least one embodiment of the present invention. Thus, the appearances of the phrases "in one embodiment" or "in an embodiment" in various places throughout this specification are not necessarily all referring to the same embodiment. Furthermore, the particular features, structures, or characteristics may be combined in any suitable manner in one or more embodiments.

[0013] FIG. 1 is a functional block diagram illustrating an imaging system 100, in accordance with an embodiment of the invention. The illustrated embodiment of imaging system 100 includes a light source frequency detection circuit 105, a photo-

sensor 110, an imaging pixel array 115, and pixel control logic 120.

[0014] Imaging system 100 may be included within any number of electronic devices, such as video cameras, still image cameras, optical scanners, or other light sensing devices. Imaging pixel array 115 may be implemented with a variety of different imaging technologies, such as charged-coupled device ("CCDs") arrays, complementary metal-oxide-semiconductor ("CMOS") arrays, or other semiconductor or non- semiconductor imaging arrays. Pixel control logic 120 is coupled to imaging pixel array 115 to control and manage imaging pixel array 115 during operation. For example, pixel control logic 120 may configure operating parameters of imaging pixel array 115, reset the individual pixels, shift acquired images out of imaging pixel array 115, or otherwise. Some of the operating parameters controlled by pixel control logic 120 may include setting an exposure time, synchronizing image acquisition, setting image gain, or otherwise.

[0015] In one embodiment, photo-sensor 110 is a standalone sensor distinct from imaging pixel array 115. In another embodiment, photo-sensor 110 may represent one or more pixel elements from within imaging pixel array 115. In one embodiment, photo-sensor 110 is implemented with a photo-diode.

[0016] During operation, photo-sensor 110 and light source frequency detection circuit 105 operate to determine the power frequency of external light 125. Light 125 may be light from the object/person being imaged or ambient light. Once light source frequency detection circuit 105 determines the power frequency of light 125, it outputs a frequency select ("FREQ SEL") signal to pixel control logic 120. In response, pixel control logic 120 configures operational parameters of imaging pixel array 115 to compensate for the power frequency of light 125. As discussed above, depending upon the geographic region, light 125 will typically be generated by a light source having one of two power frequencies 50 Hz (predominant in Europe) or 60 Hz (predominant in North America).

[0017] FIG. 2 is a functional block diagram illustrating a light source frequency detection circuit 200, in accordance with an embodiment of the invention. Light source frequency detection circuit 200 is one possible embodiment of light source frequency detection circuit 105 illustrated in FIG. 1. The illustrated embodiment light source

frequency detection circuit 200 includes a modulator circuit 205, a logic unit 210, a clock source 215, clock logic 220, and charging logic 225. The illustrated embodiment of modulator circuit 205 includes a comparator 230, a latch 235, a charging source 240, and a switch 245. The illustrated embodiment of logic unit 210 includes sum-50 logic 250, sum-60 logic 255, and comparator logic 260.

[0018] In one embodiment, modulator circuit 205 operates as a sigma delta modulator that converts a variable electrical signal 270 (e.g., variable current) output by photo-sensor 110 into a modulated signal 275 output by comparator 230. Modulated signal 275 is then synchronized to the clock signal CLK by latch 235 and output on sample output Q as modulated signal 277. Modulated signal 277 is fed back to a control terminal of switch 245 (e.g., transistor switch) to selectively enable/disable switch 245. When switch 245 is closed circuited, node Nl is coupled to charging source 240. Comparator 230 may be implemented with an analog comparator for comparing the voltage at node Nl with a reference voltage VREF. Latch 235 may be implemented as a flip-flop, such as a D flip-flop having a sample input D, a sample output Q, and a clock input CLK. The operation of modulator circuit 205 is discussed in detail below in connection with FIG. 3.

[0019] In one embodiment, charging source 240 is a current source. In one embodiment, charging source 240 is a variable charging source capable of charging node Nl at a variable rate selected by charging logic 225. Charging logic 225 may be coupled to photo-sensor 110 or another photo-sensitive element to determine the intensity of light 125 and adjust the charging rate of charging source 240 appropriately. By adjusting the charging rate of charging source 240, the luminance range of light source frequency detection circuit 200 may be adjusted to compensate for a stronger/weaker electrical signal 270 when light 125 incident on photo-sensor 110 is more/less intense.

[0020] In one embodiment, clock source 215 can generate an adjustable clock signal CLK under control of clock logic 220. Clock logic 220 may vary the frequency of the clock signal CLK to increase or decrease the dynamic range of light source frequency detection circuit 200. In one embodiment, the clock signal CLK is approximately 3 MHz. Other frequencies may be used.

[0021] Logic unit 210 is coupled to receive modulated signal 277 and the clock

signal CLK. Based upon modulated signal 277 and the clock signal CLK, logic unit 210 is capable of determining the toggle frequency of modulated signal 277, which is substantially proportional (e.g., 2 times) to the power frequency of incident light 125. In one embodiment, logic unit 210 is implemented in hardware using digital signal processing ("DSP") techniques. In other embodiments, logic unit 210 may be implemented by software executing on a general purpose processor, an application specific integrated circuit ("ASIC"), a combination thereof, or otherwise. The operation of logic unit 210 is described in detail below in connection with FIGs. 4, 5A, and 5B.

[0022] FIG. 3 is a flow chart illustrating a process 300 for operation of modulator circuit 200, in accordance with an embodiment of the invention. The order in which some or all of the process blocks appear in process 300 should not be deemed limiting. Rather, one of ordinary skill in the art having the benefit of the present disclosure will understand that some of the process blocks may be executed in a variety of orders not illustrated.

[0023] In a process block 305, light source frequency detection circuit 200 is powered on and photo-sensor 110 exposed to a light source emitting light 125. In a process block 310, incident light 125 causes photo-sensor 110 to generate electrical signal 270. In the illustrated embodiment, electrical signal 270 has the effect of pulling down node Nl coupled to the positive input of comparator 230 towards ground (GND). It should be appreciated that the circuit of FIG. 2 may be modified to pull node Nl up towards the high supply voltage VCC instead.

[0024] In a decision block 315, when the voltage on node Nl is pulled below the reference voltage VREF coupled to the negative terminal of comparator 230, modulated signal 275 is toggled low to '0' (process block 320). Modulated signal 275 output by comparator 230 is synchronized to the clock signal CLK by latch 235. In a process block 325, latch 235 latches the '0' value on its sample input D to its sample output Q.

[0025] Modulated signal 277 (synchronized version of modulated signal 275) is fed back to control switch 245 and selectively enable/disable charging of node Nl. In a process block 330, the '0' value of modulated signal 277 causes switch 245 to close circuit thereby coupling charging source 240 to node Nl. In a process block 335,

charging source 240 commences charging node Nl until voltage (VNl) on node Nl is pulled above VREF (decision block 340). Once VNl is greater than VREF, comparator 230 toggles its output high '1' (process block 345), which is then latched by latch 235 from its sample input D to its sample output Q (process block 350). Accordingly, latch 235 operates to generate a '0' pulse or a '1' pulse according to the voltage VNl on node Nl. The pulses have a pulse width determined by the width of the clock signal CLK. Finally, in process block 355, switch 245 is open circuited under control of modulated signal 277. Process 300 then returns to process block 310 and repeats to generate modulated signal 277.

[0026] The photocurrent generated by photo-sensor 110 varies in magnitude with the varying intensity of incident light 125. Accordingly, if incident light 125 is flickering due to a 50 Hz or 60 Hz power source, then the magnitude of electrical signal 270 will also oscillate with a corresponding 50 Hz or 60 Hz frequency (or multiple thereof). Accordingly, modulated signal 277 toggles at a rate proportional (e.g., 2 times) to the power frequency of incident light 125.

[0027] FIG. 4 is a flow chart illustrating a process 400 for operation of logic unit 210 for determining the toggling frequency of modulated signal 277, in accordance with an embodiment of the invention. The order in which some or all of the process blocks appear in process 400 should not be deemed limiting. Rather, one of ordinary skill in the art having the benefit of the present disclosure will understand that some of the process blocks may be executed in a variety of orders not illustrated.

[0028] Logic unit 210 operates to determine the frequency of modulated signal 277 by generating two summation values and then comparing these summations values to generate the frequency select signal. Modulated signal 277 is coupled into both sum-50 logic 250 and sum-60 logic 255. In a process block 405, sum-50 logic 250 computes a sum50 according to equation (1) below

SUm50 = ∑δ|b ₊₆ - b | , (Equation 1) where b _t represents an area under a curve per sampling block i of modulated signal 277. Referring to FIG. 5A, a 50 Hz sampling plot 505 of intensity versus time is illustrated. The flickering nature of a light 125 due to its AC power source generates a sine curve 510 in modulated signal 277. Modulated signal 277 may be sampled at a rate determined

by the clock signal CLK (e.g., 3 MHz). Each sampling block SO, Sl ... SN (i.e., i = 0, 1 ... N) includes a plurality of sample points (represented as dotted vertical lines under sine curve 510) along sine curve 510. For example, each sample block i may include 5000 sample points, depending upon the frequency of the clock signal CLK. The coefficients bo, bi, b ₂ , ... b _N represent the summation or integration of these sample points within the associated sampling block i, which also represents the area under sine curve 510 within the associated sampling block i. The summation sum50 may be accumulated by sum-50 logic 250 for a fixed period of time (e.g., 1 second) or a fixed number clock cycles, and then repeated.

[0029] In a process block 410, sum-60 logic 255 computes a sumόO according to equation (2) below,

5Mm50 = ^δ|b ₊₆ - b , (Equation 2) where b _t represents an area under a curve per sampling block i of modulated signal 277. Referring to FIG. 5B, a 60 Hz sampling plot 515 of intensity versus time is illustrated. The flickering nature of light 125 due to its AC power source generates a sine curve 520 in modulated signal 277. Again, modulated signal 277 is sampled at a rate determined by the clock signal CLK (e.g., 3 MHz). Each sampling block SO, Sl ... SN (i.e., i = 0, 1 ... N) includes a plurality of sample points (represented as dotted vertical lines under sine curve 520) along sine curve 520. For example, each sample block i may include 5000 sample points, depending upon the frequency of the clock signal CLK. The coefficients b ₀ , bi, b ₂ , ... b _N represent the summation or integration of these sample points within the associated sampling block i, which also represents the area under sine curve 520 within the associated sampling block i. The summation sumόO may be accumulated by sum-60 logic 255 for a fixed period of time (e.g., 1 second) or a fixed number clock cycles, and then repeated. Since sum50 and sumόO are both generated based on modulated signal 277, process blocks 405 and 410 may be preformed sequentially in any order or in parallel.

[0030] Once sum-50 logic 250 and sum-60 logic 255 have generated their respective summation values sum50 and sum60, comparator logic 260 compares the two summation values to determine which is greater (decision block 415). If comparator logic 260 determines that sum50 is less than sum60, then the power frequency of light

125 is determined to be 50 Hz and comparator logic 260 outputs the frequency select signal indicating such (process block 420). If comparator logic 260 determines that sum50 is greater than sum60, then the power frequency of light 125 is determined to be 60 Hz and comparator logic 260 outputs the frequency select signal indicating such (process block 425). The frequency select signal may be provided to pixel control logic 120 to adjust operational parameters of imaging pixel array 115 and improve image acquisition.

[0031] The processes explained above are described in terms of computer software and hardware. The techniques described may constitute machine-executable instructions embodied within a machine (e.g., computer) readable medium, that when executed by a machine will cause the machine to perform the operations described. Additionally, the processes may be embodied within hardware, such as an application specific integrated circuit ("ASIC") or the like.

[0032] A machine-accessible medium includes any mechanism that provides (i.e., stores) information in a form accessible by a machine (e.g., a computer, network device, personal digital assistant, manufacturing tool, any device with a set of one or more processors, etc.). For example, a machine-accessible medium includes recordable/non-recordable media (e.g., read only memory (ROM), random access memory (RAM), magnetic disk storage media, optical storage media, flash memory devices, etc.).

[0033] The above description of illustrated embodiments of the invention, including what is described in the Abstract, is not intended to be exhaustive or to limit the invention to the precise forms disclosed. While specific embodiments of, and examples for, the invention are described herein for illustrative purposes, various modifications are possible within the scope of the invention, as those skilled in the relevant art will recognize.

[0034] These modifications can be made to the invention in light of the above detailed description. The terms used in the following claims should not be construed to limit the invention to the specific embodiments disclosed in the specification. Rather, the scope of the invention is to be determined entirely by the following claims, which are to be construed in accordance with established doctrines of claim interpretation.