LINE QUALITY REPORT ACCURACY MEASUREMENT DEVICE AND ACCURACY MEASUREMENT METHOD

Title:

LINE QUALITY REPORT ACCURACY MEASUREMENT DEVICE AND ACCURACY MEASUREMENT METHOD

Document Type and Number:

WIPO Patent Application WO/2004/066547

Kind Code:

A1

Abstract:

A line quality report accuracy measurement device and accuracy measurement method capable of accurately measuring the accuracy of line quality reported from a communication device. A method control section (140) contains an encoding ratio corresponding to the CQI and a modulation method and specifies a transmission method corresponding to the fixed CQI reported from a CQI statistic processing section (230). A CQI decoding section (220) decodes a report CQI contained in the reception signal. The CQI statistic processing section (230) statistically processes the report CQI corresponding to the test data transmitted prior to an accuracy measurement test and notifies the CQI which has been reported most frequently as a fixed CQI to the method control section (140). A PER calculation section (260) calculates PER in the communication device according to the report CQI and Ack/Nack corresponding to the test data transmitted in accordance with the fixed CQI. A judgment section (270) performs a threshold value judgment for PER for each report CQI value and outputs the judgment result of the accuracy of the report CQI.

Inventors:

SHINOI KENICHIRO (JP)
SUZUKI HIDETOSHI (JP)

Application Number:

PCT/JP2003/015944

Publication Date:

August 05, 2004

Filing Date:

December 12, 2003

Export Citation:

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Assignee:

MATSUSHITA ELECTRIC IND CO LTD (JP)
SHINOI KENICHIRO (JP)
SUZUKI HIDETOSHI (JP)

International Classes:

H04B17/24; H04B17/309; H04L1/16; H04L1/20; H04L1/24; H04W24/00; H04W24/06; H04W24/10; (IPC1-7): H04L1/00

Domestic Patent References:

WO2002025853A2

2002-03-28

Foreign References:

JPH11313040A	1999-11-09
JP2001268148A	2001-09-28

Other References: