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Patent Searching and Data


Title:
LINEAR ARRAY SCANNING DEVICE AND CONTROL METHOD
Document Type and Number:
WIPO Patent Application WO/2024/074087
Kind Code:
A1
Abstract:
A linear array scanning device and a control method. The linear array scanning device comprises: a carrier assembly (11) for carrying a magnetic sample (12) to be tested; a first magnetic field generation assembly comprising two sets of first magnetic assemblies (13) arranged opposite each other and used for generating a first gradient magnetic field, the carrier assembly (11) being arranged within the first gradient magnetic field; a light source assembly (14) for outputting linearly polarized light; a first beam-splitting assembly (15) arranged on a light emergent path of the light source assembly (14) and used for receiving the linearly polarized light, splitting the linearly polarized light into a plurality of beams of first sub linearly polarized light, and projecting the first sub linearly polarized light, which propagates in a first direction, to a first detection region of the magnetic sample (12) to be tested; and a first detection assembly (16) for receiving first reflected linearly polarized light reflected back from the first detection region, and detecting polarization information of the first reflected linearly polarized light, and acquiring magnetic domain uniformity information of the magnetic sample (12) to be tested. The linear array scanning device can achieve linear array scanning, thereby improving the scanning speed and shortening the scanning time.

Inventors:
YANG HUANGLIN (CN)
WU YANG (CN)
Application Number:
PCT/CN2023/116542
Publication Date:
April 11, 2024
Filing Date:
September 01, 2023
Export Citation:
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Assignee:
ADVANCED TERAHERTZ SYSTEMS SUZHOU CO LTD (CN)
International Classes:
G01R33/12; G01R33/14
Attorney, Agent or Firm:
SCIHEAD IP LAW FIRM (CN)
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