Title:
LOAD TESTING DEVICE
Document Type and Number:
WIPO Patent Application WO/2024/105840
Kind Code:
A1
Abstract:
Provided are, inter alia, a load testing device in which a relay is used and in which individual differences in performance are lessened. The load testing device comprises a U-phase resistor, a V-phase resistor, a W-phase resistor, a first semiconductor relay group for performing ON/OFF control of the supply of electrical power from a power source under testing to the U-phase resistor, a second semiconductor relay group for performing ON/OFF control of the supply of electrical power from the power source under testing to the V-phase resistor, and a third semiconductor relay group for performing ON/OFF control of the supply of electrical power from the power source under testing to the W-phase resistor. A plurality of semiconductor relays of the first semiconductor relay group and the U-phase resistor are serially connected. A plurality of semiconductor relays of the second semiconductor relay group and the V-phase resistor are serially connected. A plurality of semiconductor relays of the third semiconductor relay group and the W-phase resistor are serially connected.
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Inventors:
KONDO TOYOSHI (JP)
Application Number:
PCT/JP2022/042670
Publication Date:
May 23, 2024
Filing Date:
November 17, 2022
Export Citation:
Assignee:
TATSUMI RYOKI CO LTD (JP)
International Classes:
G01R31/34
Domestic Patent References:
WO2016185579A1 | 2016-11-24 | |||
WO2022196317A1 | 2022-09-22 |
Foreign References:
JP2000019231A | 2000-01-21 | |||
JP2022143043A | 2022-10-03 | |||
CN211127757U | 2020-07-28 | |||
JP2020148520A | 2020-09-17 | |||
JPS4928230B1 | 1974-07-24 | |||
JP2010025752A | 2010-02-04 |
Attorney, Agent or Firm:
NONAKA, Takeshi (JP)
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