Title:
LOOP ITERATION CALIBRATION METHOD AND TEST DEVICE USING SAME
Document Type and Number:
WIPO Patent Application WO/2022/213877
Kind Code:
A1
Abstract:
A loop iteration calibration method and a test device (10) using same. The loop iteration calibration method comprises: an inner loop step (S10) and an outer loop step (S20). The inner loop step (S10) comprises: adjusting input power of a first known good unit by means of a first gradient algorithm according to target power and output power, and then adjusting the input power by means of a second gradient algorithm, the step size of the first gradient algorithm being greater than the step size of the second gradient algorithm; and taking a first average value for the input power adjusted by means of the second gradient algorithm. The outer loop step (S20) comprises: performing the inner loop step (S10) by using the second known good unit to obtain a second average value of the second known good unit; and averaging the first average value and the second average value to obtain a final average value, and calibrating the test device (10) according to the final average value. The effects of the present invention comprise: the number of tests can be reduced, the efficiency of calibration can be improved, and errors due to difference in working performance of multiple known good units or a random error of a single known good unit can be reduced.
Inventors:
XU WEI (CN)
WANG NORRIS (CN)
WANG NORRIS (CN)
Application Number:
PCT/CN2022/084406
Publication Date:
October 13, 2022
Filing Date:
March 31, 2022
Export Citation:
Assignee:
ADVANTEST CORP (CN)
International Classes:
G01R35/00
Foreign References:
| CN101750597A | 2010-06-23 | |||
| CN112462312A | 2021-03-09 | |||
| CN111308315A | 2020-06-19 | |||
| CN103744010A | 2014-04-23 | |||
| CN108291937A | 2018-07-17 | |||
| CN212008827U | 2020-11-24 | |||
| JPH0537248A | 1993-02-12 |
Attorney, Agent or Firm:
SHANGHAI BESHINING LAW OFFICE (CN)
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