Title:
MAGNETIC RESONANCE IMAGING DEVICE AND HIGH FREQUENCY MAGNETIC FIELD SHIM PARAMETER DETERMINATION METHOD
Document Type and Number:
WIPO Patent Application WO/2016/002446
Kind Code:
A1
Abstract:
In order to perform quick and high accuracy RF shimming in an MRI device to obtain a high quality image independent of the subject and the imaging mode, a database is provided which stores shim parameters in advance that correspond to change from the reference state, where the state in which a shim parameter has been calculated is defined as the reference state of the subject. During imaging, the shim parameter is used which is registered in the database associated with the amount of change closest to the amount of change from the reference state. In the database, shim parameters are registered which are calculated from the results of past measurements.
Inventors:
YOSHIDA TAKU (JP)
KURATANI ATSUSHI (JP)
KURATANI ATSUSHI (JP)
Application Number:
PCT/JP2015/066693
Publication Date:
January 07, 2016
Filing Date:
June 10, 2015
Export Citation:
Assignee:
HITACHI MEDICAL CORP (JP)
International Classes:
A61B5/055
Foreign References:
| JP2011131045A | 2011-07-07 | |||
| US20080231270A1 | 2008-09-25 |
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