Title:
MALFUNCTION DETERMINATION DEVICE, MALFUNCTION DETERMINATION SYSTEM, AND MALFUNCTION DETERMINATION METHOD
Document Type and Number:
WIPO Patent Application WO/2023/176139
Kind Code:
A1
Abstract:
This malfunction determination device comprises: an acquisition unit that acquires the resistance of an electrothermal body of a lamp heater as calculated from the voltage at both ends of the electrothermal body and a current flowing in the electrothermal body; and a determination unit that, on the basis of the acquired resistance, carries out malfunction determination which is a determination as to whether the lamp heater is malfunctioning. The determination unit determines that the lamp heater is malfunctioning if the acquired resistance exceeds a first threshold.
More Like This:
| JP2004212510 | IMAGE FORMING APPARATUS |
| JP2005516752 | Heating in a vacuum environment where plasma is present |
| JP4261859 | Image heating device |
Inventors:
YAMADA TAKAAKI (JP)
Application Number:
PCT/JP2023/001674
Publication Date:
September 21, 2023
Filing Date:
January 20, 2023
Export Citation:
Assignee:
OMRON TATEISI ELECTRONICS CO (JP)
International Classes:
H05B3/00
Foreign References:
| JP2011108596A | 2011-06-02 | |||
| JP2005073315A | 2005-03-17 | |||
| JP2008269853A | 2008-11-06 | |||
| JP2002260823A | 2002-09-13 | |||
| JP2017090644A | 2017-05-25 | |||
| JP2003162980A | 2003-06-06 | |||
| JP2020118772A | 2020-08-06 | |||
| JPH03295183A | 1991-12-26 | |||
| KR100722260B1 | 2007-05-29 |
Attorney, Agent or Firm:
YAMAO, Norihito et al. (JP)
Download PDF: