Title:
MALFUNCTION DIAGNOSTIC CIRCUIT OF CELL BALANCING CIRCUIT
Document Type and Number:
WIPO Patent Application WO/2014/030860
Kind Code:
A1
Abstract:
According to one embodiment of the invention, the present invention relates to a malfunction diagnostic circuit of a cell balancing circuit and, more specifically, to a malfunction diagnostic circuit of a cell balancing circuit, comprising: a battery pack unit comprising one or more battery cells; a balancing circuit unit which is connected to the battery pack unit so as to adjust a deviation of the battery cells, and which comprises a first field effect transistor (FET), which is a junction FET, and a second FET, which is a MOSFET; and a malfunction diagnosis unit which is connected to the balancing circuit part so as to determine whether or not the first FET of the balancing circuit part is malfunctioning, and which comprises a current sensing resistor and an AND gate.
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Inventors:
KIM SANG HOON (KR)
Application Number:
PCT/KR2013/007151
Publication Date:
February 27, 2014
Filing Date:
August 08, 2013
Export Citation:
Assignee:
SK INNOVATION CO LTD (KR)
International Classes:
G01R31/36; G01R19/165
Foreign References:
| JP2007085847A | 2007-04-05 | |||
| KR20110100863A | 2011-09-15 | |||
| KR20100023364A | 2010-03-04 | |||
| JP2011076778A | 2011-04-14 | |||
| KR100921647B1 | 2009-10-14 |
Attorney, Agent or Firm:
KWON, Oh-Sig et al. (KR)
권오식 (KR)
권오식 (KR)
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