Title:
MANUAL TEST DEVICE
Document Type and Number:
WIPO Patent Application WO/2005/106512
Kind Code:
A1
Abstract:
A manual test device (1) is constituted by an IC device receiving member (2) which is removably fitted in a socket guide (6) and which is capable of controlling the planar position of an IC device (7) with respect to the connection terminal of a socket (51), and a height control device (3) having an abutment member (31) whose vertical position is variable and which abuts against the upper surface of the IC device (7) to control the vertical position of the IC device (7). The vertical position of the abutment member (31) can be changed by a combination of a block (35) formed with a plurality of grooves (351) different in depth, and a control member (34) formed with an arm section (342) adapted to fit in the grooves (351) in the block (35).
Inventors:
NAGASHIMA MASANORI (JP)
Application Number:
PCT/JP2004/006305
Publication Date:
November 10, 2005
Filing Date:
April 30, 2004
Export Citation:
Assignee:
ADVANTEST CORP (JP)
NAGASHIMA MASANORI (JP)
NAGASHIMA MASANORI (JP)
International Classes:
G01R1/04; G01R31/26; (IPC1-7): G01R31/26
Foreign References:
| JP2003243117A | 2003-08-29 | |||
| JPH05249182A | 1993-09-28 | |||
| JPH03183972A | 1991-08-09 | |||
| JPH10197598A | 1998-07-31 |
Attorney, Agent or Firm:
Hayakawa, Yuzi (Suite 501 Hikawa-Annex No.2, 9-5, Akasaka
6-chome, Minato-k, Tokyo 52, JP)
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