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Patent Searching and Data


Title:
MASS SPECTROMETER AND LIQUID-METAL ION SOURCE FOR A MASS SPECTROMETER OF THIS TYPE
Document Type and Number:
WIPO Patent Application WO2005029532
Kind Code:
A3
Abstract:
The invention relates to a mass spectrometer comprising an ion source for producing a primary ion beam, which has a heatable ion emitter coated by a liquid-metal layer, which is essentially comprised of pure metallic bismuth or of a low-melting-point alloy containing, in essence, bismuth. A bismuth ion mixed beam can be emitted by the ion emitter under the influence of an electric field. From said bismuth ion mixed beam, one of a number of bismuth ion types, whose mass is a multiple of the monatomic singly or multiply charged bismuth ions Bi

Inventors:
KOLLMER FELIX (DE)
HOERSTER PETER (DE)
Application Number:
PCT/EP2004/007154
Publication Date:
April 20, 2006
Filing Date:
July 01, 2004
Export Citation:
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Assignee:
ION TOF GMBH (DE)
KOLLMER FELIX (DE)
HOERSTER PETER (DE)
International Classes:
H01J27/26; H01J49/10; H01J49/16; H01J49/26; H01J49/40; (IPC1-7): H01J49/16; H01J49/40; H01J27/26
Foreign References:
US4686414A1987-08-11
Other References:
S.S. JOHAR, D.A. THOMPSON: "Spike effects in heavy-ion sputtering of Ag, Au and Pt thin films", SURFACE SCIENCE, vol. 90, 1979, pages 319 - 330, XP002366490
J. VAN DER WALLE, P. JOYES: "Study of Bi(n)(p+) ions formed in liquid-metal ion sources", PHYSICAL REVIEW B, vol. 35, no. 11, 15 April 1987 (1987-04-15), pages 5509 - 5513, XP002366516
HEINRICH R ET AL: "Cluster formation under bombardment with polyatomic projectiles", NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, SECTION - B: BEAM INTERACTIONS WITH MATERIALS AND ATOMS, ELSEVIER, AMSTERDAM, NL, vol. 164-165, April 2000 (2000-04-01), pages 720 - 726, XP004195249, ISSN: 0168-583X
LE BEYEC Y: "Cluster impacts at keV and MeV energies: Secondary emission phenomena", INTERNATIONAL JOURNAL OF MASS SPECTROMETRY, ELSEVIER SCIENCE PUBLISHERS, AMSTERDAM, NL, vol. 174, no. 1-3, March 1998 (1998-03-01), pages 101 - 117, XP004116637, ISSN: 1387-3806
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