Title:
MASS SPECTROMETER
Document Type and Number:
WIPO Patent Application WO/2020/170335
Kind Code:
A1
Abstract:
One aspect of the mass spectrometer according to the present invention comprises: a conductive probe; a probe moving unit which, in order to attach a sample to the probe tip, vertically moves the probe between a sample collection position where the probe tip comes into contact with a sample disposed in a prescribed location, and a prescribed ion generation position where the tip is separated from the sample; a high-voltage applying unit which applies a high voltage to the probe when in the ion generation position, and which causes ions derived from the sample components to be generated from the sample attached to the probe; and a sample holding unit (sample plate (4)) which includes a sample housing part (turret part (42)) that has multiple recesses (421) each capable of housing a sample, and a pedestal part (base part (41)) that separably holds the sample housing part and that is provided with mechanical elements (gears (412, 413)) for moving the sample housing part such that the multiple recesses in the sample housing part are moved one by one to the sample collection position.
Inventors:
FUJIOKA SHINGO (JP)
ISHIHARA HIKARU (JP)
ISHIHARA HIKARU (JP)
Application Number:
PCT/JP2019/006120
Publication Date:
August 27, 2020
Filing Date:
February 19, 2019
Export Citation:
Assignee:
SHIMADZU CORP (JP)
International Classes:
H01J49/10; G01N27/62
Domestic Patent References:
| WO2017154153A1 | 2017-09-14 |
Foreign References:
| JPH10213567A | 1998-08-11 | |||
| JP2014517481A | 2014-07-17 |
Attorney, Agent or Firm:
KYOTO INTERNATIONAL PATENT LAW OFFICE (JP)
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