MASS SPECTROMETRY DATA ANALYSIS TECHNIQUES

Title:

MASS SPECTROMETRY DATA ANALYSIS TECHNIQUES

Document Type and Number:

WIPO Patent Application WO2004089972

Kind Code:

A3

Abstract:

The present invention features mass spectrometry data analysis techniques that can be employed to selectively identify analytes differing in abundance between different sample sets. The employed techniques determine the statistical significance of changes to signals associated with mass-to-charge ratios ("m/z intensity pairs") between individual samples and sample sets. Based on the statistical significance, changes likely to indicate analyte level differences are identified. Based on intensities of the signals, ratios of analyte abundances can be determined.

Inventors:

SACHS JEFFREY R (US)
WIENER MATTHEW C (US)
YATES NATHAN A (US)

Application Number:

PCT/US2004/010108

Publication Date:

February 24, 2005

Filing Date:

March 31, 2004

Export Citation:

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Assignee:

MERCK & CO INC (US)
SACHS JEFFREY R (US)
WIENER MATTHEW C (US)
YATES NATHAN A (US)

International Classes:

G06F19/00; G16B40/10; H01J49/00; H01J49/04; H01J49/16; C07K; (IPC1-7): H01J49/00; G06F19/00

Foreign References:

US6188064B1	2001-02-13
US6393367B1	2002-05-21

Other References: