Title:
MEASUREMENT APPARATUS, INSPECTION APPARATUS, AND SURFACE MOUNTING MACHINE
Document Type and Number:
WIPO Patent Application WO/2021/210128
Kind Code:
A1
Abstract:
A measurement apparatus 1 comprises: a projector 2 that projects stripe-pattern light having periodically changing lightness to an object M; a camera 3 that photographs the stripe-pattern light projected to the object; and an arithmetic device 7. The projector 2 projects, to the object M, first stripe-pattern light L1 having a first period, second stripe-pattern light L2 having a second period, and third stripe-pattern light L3 having a third period, with the setting of the first period ˂ the second period ˂ the third period. The camera 3 photographs each of the first stripe-pattern light L1, the second stripe-pattern light L2, and the third stripe-pattern light L3 projected to the object M. The arithmetic device 7 performs phase analysis of luminance I by a phase shift method for each of an image G of the first stripe-pattern light L1, an image G of the second stripe-pattern light L2, and an image G of the third stripe-pattern light L3 photographed by the camera 3, and calculates the height H of the object M on the basis of the obtained phase analysis result.
Inventors:
TABATA NOBUAKI (JP)
Application Number:
PCT/JP2020/016720
Publication Date:
October 21, 2021
Filing Date:
April 16, 2020
Export Citation:
Assignee:
YAMAHA MOTOR CO LTD (JP)
International Classes:
G01B11/25
Foreign References:
| JP2010281665A | 2010-12-16 | |||
| JP2005249684A | 2005-09-15 | |||
| JP2020038074A | 2020-03-12 |
Attorney, Agent or Firm:
AKATSUKI UNION PATENT FIRM (JP)
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