Title:
MEASUREMENT DEVICE AND MEASUREMENT METHOD
Document Type and Number:
WIPO Patent Application WO/2021/044712
Kind Code:
A1
Abstract:
This measurement device is provided with a calculation unit and a correction unit. The calculation unit selects two pieces of waveform data from three or more pieces of waveform data each including an attribute value and an observed value associated with the attribute value, repeats calculation of the difference in attribute value between the two selected pieces of waveform data and the correlation in shape between the two selected pieces of waveform data, and calculates multiple difference-correlation pairs which are pairs of the difference between the attribute values and the correlation. The correction unit corrects the difference between the attribute values on the basis of the correlation paired with the difference between the attribute values.
Inventors:
TOMIZAWA RYOTA
ADACHI YOSHIHISA
IWAI YOSHIFUMI
EDO YUKI
OGAWA RIEKO
ADACHI YOSHIHISA
IWAI YOSHIFUMI
EDO YUKI
OGAWA RIEKO
Application Number:
PCT/JP2020/025114
Publication Date:
March 11, 2021
Filing Date:
June 26, 2020
Export Citation:
Assignee:
SHARP KK (JP)
International Classes:
A61B5/02
Domestic Patent References:
| WO2008135892A2 | 2008-11-13 | |||
| WO2019116996A1 | 2019-06-20 |
Foreign References:
| JP2019110987A | 2019-07-11 |
Attorney, Agent or Firm:
INOUE Tomoya (JP)
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