Title:
MEASUREMENT DEVICE
Document Type and Number:
WIPO Patent Application WO/2013/190855
Kind Code:
A1
Abstract:
A device provided with: a sensor unit which is configured from a coil and a conductor that are disposed such that the area of an overlapping portion changes according to the change of the position of an object to be detected; a capacitor and a resistor which, together with the coil, constitute a series circuit; a voltage application means which applies input voltage (Vi) to the series circuit; a phase detection means which detects the phase of the voltage (Vo) between both ends of the capacitor; a magnitude detection means which detects the magnitude of the voltage (Vo) between both ends; characteristic data in which the phase, the magnitude, the temperature of the sensor unit, and the area of the overlapping portion are associated, and a calculation means which calculates the temperature and the area of the overlapping portion on the basis of the phase and magnitude of the actually measured voltage (Vo) between both ends, and the characteristic data.
Inventors:
ONISHI KENICHI (JP)
YAMAMOTO KENJI (JP)
YAMAMOTO KENJI (JP)
Application Number:
PCT/JP2013/050152
Publication Date:
December 27, 2013
Filing Date:
January 09, 2013
Export Citation:
Assignee:
LEVEX CORP (JP)
International Classes:
G01D21/02; G01B7/00; G01D5/20; G01K7/36
Foreign References:
| JP2006300719A | 2006-11-02 | |||
| JP2004012316A | 2004-01-15 | |||
| JP2003315166A | 2003-11-06 | |||
| JP2003014493A | 2003-01-15 | |||
| JPH1078336A | 1998-03-24 | |||
| JP4189872B2 | 2008-12-03 | |||
| JP4699797B2 | 2011-06-15 |
Other References:
See also references of EP 2713144A4
Attorney, Agent or Firm:
ARICHIKA SHINSHIRO (JP)
Owner 近紳志郎 (JP)
Owner 近紳志郎 (JP)
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