MEASUREMENT DEVICE - UNIV KYUSHU NAT UNIV CORP

Title:

MEASUREMENT DEVICE

Document Type and Number:

WIPO Patent Application WO/2016/174993

Kind Code:

A1

Abstract:

The amount of time that a subject is under the static magnetic field of a rotating-type MRI device is dependent on the rotational-direction width of a magnet. Conventional rotating-type MRI devices require that the width of the magnet be altered in order to alter the amount of time that the subject is under the static magnetic field. Provided is a measurement device that is provided with: a pair of rotating units that are provided in different positions in the axial direction with respect to a rotating shaft and that rotate around the rotating shaft; and a non-rotating unit that is provided in a space between the pair of rotating units and that is for installing a measurement target. At least one of the pair of rotating units has: a first magnet that generates a first magnetic field in the space between the pair of rotating units and that is housed in a first range of the rotating unit, the first range being on a circle that is centered on the rotating shaft; and a second magnet that generates a second magnetic field in the space between the pair of rotating units and that is housed in a second range of the rotating unit, the second range being on a circle that is centered on the rotating shaft and being different from the first range.

Inventors:

UTSUMI HIDEO (JP)
IIKURA ATUSHI (JP)
SUGIYAMA EIJI (JP)

Application Number:

PCT/JP2016/060901

Publication Date:

November 03, 2016

Filing Date:

April 01, 2016

Export Citation:

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Assignee:

UNIV KYUSHU NAT UNIV CORP (JP)
FUJI ELECTRIC CO LTD (JP)
HITACHI METALS LTD (JP)

International Classes:

A61B5/055; G01N24/10; G01R33/383; G01R33/48; H01F7/02; G01R33/28

Domestic Patent References:

WO2004069052A1

2004-08-19

Foreign References:

JPH07327958A	1995-12-19
JP2008259876A	2008-10-30
JP2007519451A	2007-07-19
JP2000116640A	2000-04-25