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Patent Searching and Data


Title:
MEASUREMENT VALUE PROCESSING METHOD AND MEASUREMENT VALUE PROCESSING SYSTEM
Document Type and Number:
WIPO Patent Application WO/2024/004281
Kind Code:
A1
Abstract:
The present invention comprises: a reference value searching step for searching for a reference value R from among N measurement values; a selection step for selecting M measurement values by excluding, from the estimation target, N-M measurement values, as outliers, in descending order of deviation from the reference value R, among the N measurement values, on the basis of the reference value R searched for in the reference value searching step; and an estimation value calculation step for setting an average value of the M measurement values selected in the selection step as an estimation value of a true value. The reference value searching step includes a loop repeating from a state n=N until n=1, a process for determining the median or average value of the n measurement values, excluding one measurement value with the largest deviation from the median value or the average value among the n measurement values, and setting n-1 measurement values as candidates for the reference value R, and after the loop ends, one last remaining measurement value as the candidate is set as the reference value R.

Inventors:
INOUE TAIMU (JP)
Application Number:
PCT/JP2023/009054
Publication Date:
January 04, 2024
Filing Date:
March 09, 2023
Export Citation:
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Assignee:
SHIMADZU CORP (JP)
International Classes:
G01F23/80; G01F23/2962
Foreign References:
JP2021523370A2021-09-02
US20150169706A12015-06-18
CN101330030A2008-12-24
Other References:
GRUBBS FRANK E.: "Sample Criteria for Testing Outlying Observations", THE ANNALS OF MATHEMATICAL STATISTICS, vol. 21, no. 1, 1 March 1950 (1950-03-01), pages 27 - 58, XP093121966, DOI: 10.1214/aoms/1177729885
Attorney, Agent or Firm:
NOGUCHI Daisuke (JP)
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