Title:
MEASURING DEVICE, INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND PROGRAM
Document Type and Number:
WIPO Patent Application WO/2018/131308
Kind Code:
A1
Abstract:
This measuring device includes: an irradiation unit that diagonally irradiates a surface with light; a detection unit that detects the intensity distribution of reflection light from the surface; a processing unit that obtains a two-dimensional bidirectional reflectance distribution function (BRDF) of the surface on the basis of the intensity distribution; and a display unit that displays the BRDF thus obtained by the processing unit. The detection unit detects the intensity distribution within a direction range, which includes first direction, i.e., the direction of regular reflection light from the surface, and which does not include the direction that forms, with the first direction, an angle equal to or larger than the angle formed between the first direction and second direction orthogonal to the surface.
Inventors:
KUROKI YUKIE (JP)
Application Number:
PCT/JP2017/042952
Publication Date:
July 19, 2018
Filing Date:
November 30, 2017
Export Citation:
Assignee:
CANON KK (JP)
International Classes:
G01N21/55; G01N21/57
Foreign References:
| JPH08501880A | 1996-02-27 | |||
| JP2014126408A | 2014-07-07 | |||
| JP2009507537A | 2009-02-26 | |||
| JP2009150876A | 2009-07-09 | |||
| JPS62265537A | 1987-11-18 | |||
| JPS62197718A | 1987-09-01 | |||
| US20110234621A1 | 2011-09-29 | |||
| JP2014126408A | 2014-07-07 | |||
| JP2016211999A | 2016-12-15 | |||
| JP2017004614A | 2017-01-05 |
Other References:
BECKER: "Evaluation and characterization of display reflectance", DISPLAYS, vol. 19, no. 1, 2 June 1998 (1998-06-02), pages 35 - 54, XP004134069
See also references of EP 3570010A4
See also references of EP 3570010A4
Attorney, Agent or Firm:
OHTSUKA, Yasunori et al. (JP)
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