Title:
MEASURING DEVICE AND MEASURING METHOD
Document Type and Number:
WIPO Patent Application WO/2019/235021
Kind Code:
A1
Abstract:
Provided are a measuring device 2 and a measuring method, the measuring device 2 being provided with: a measuring instrument 4 which is mounted to a movable body 20 of a machine tool and of which the measurement position or the measurement direction can be changed in accordance with an action of the movable body 20; and a control unit 6 which converts local coordinates acquired by the measuring instrument 4 into world coordinates, and performs calibration for conversion from the local coordinates to the world coordinates, wherein the control unit 6 determines a calibration class on the basis of required measurement accuracy or the type of a to-be-restricted part 10 which is an interface between the measuring instrument 4 and the movable body 20, and executes a control process regarding the calibration on the basis of the determined calibration class.
Inventors:
YAMADA TOMOAKI (JP)
Application Number:
PCT/JP2019/010615
Publication Date:
December 12, 2019
Filing Date:
March 14, 2019
Export Citation:
Assignee:
DMG MORI CO LTD (JP)
International Classes:
G01B21/00; B23Q17/20; G01B11/00
Foreign References:
JP2017021723A | 2017-01-26 | |||
JP5595798B2 | 2014-09-24 | |||
JP2003114112A | 2003-04-18 | |||
US20140157610A1 | 2014-06-12 |
Attorney, Agent or Firm:
YAMAO, Norihito et al. (JP)
Download PDF:
Previous Patent: INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND PROGRAM
Next Patent: INSPECTION DEVICE
Next Patent: INSPECTION DEVICE