Title:
MEASURING DEVICE
Document Type and Number:
WIPO Patent Application WO/2023/187856
Kind Code:
A1
Abstract:
The present disclosure relates to a measuring device that enables more accurate measurements to be made. Provided is a measuring device comprising: a PLL circuit commonly used to generate a transmission RF signal and a reception LO signal, which are high frequency signals with different frequencies; an IQ correction unit that corrects an IQ error of an LO signal used in generating at least one of the transmission RF signal or the reception LO signal; and a switching unit that switches between an ON state in which correction is performed by the IQ correction unit and an OFF state in which the correction is not performed. The present disclosure can be applied, for example, to a vector network analyzer.
Inventors:
SUZUKI NORIHITO (JP)
FUJITA HIROAKI (JP)
FUJITA HIROAKI (JP)
Application Number:
PCT/JP2022/014813
Publication Date:
October 05, 2023
Filing Date:
March 28, 2022
Export Citation:
Assignee:
SONY SEMICONDUCTOR SOLUTIONS CORP (JP)
International Classes:
G01R23/173
Foreign References:
| JP2013187817A | 2013-09-19 | |||
| JP2019087843A | 2019-06-06 | |||
| JP2008232807A | 2008-10-02 | |||
| JP2016008972A | 2016-01-18 | |||
| JP2019047424A | 2019-03-22 | |||
| US20210119837A1 | 2021-04-22 | |||
| CN110113067A | 2019-08-09 |
Attorney, Agent or Firm:
NISHIKAWA Takashi et al. (JP)
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