Title:
MEASURING SYSTEM
Document Type and Number:
WIPO Patent Application WO/2023/210295
Kind Code:
A1
Abstract:
This measuring system comprises: n (n is an integer equal to or larger than 4) measurement paths (including a measurement path (11A)) that output measurement data obtained by measuring at least one measured object; m (m is an integer equal to or larger than 2) reference signal generating circuits (including a BGR circuit (41)) that output a reference signal to be referred to by the n measurement paths and each output the reference signal to two or more of the n measurement paths; k (k is an integer equal to or larger than 2) path anomaly determination circuits (including a determination circuit (15)) that compare the measurement data outputted from two of the n measurement paths and determine the presence or absence of an anomaly; and a processing circuit (including a processing circuit (5D)) that receives the measurement data outputted from the n measurement paths and outputs from the k path anomaly determination circuits.
Inventors:
MORI RYOSUKE
ISHII TAKUYA
ISHII TAKUYA
Application Number:
PCT/JP2023/014266
Publication Date:
November 02, 2023
Filing Date:
April 06, 2023
Export Citation:
Assignee:
NUVOTON TECH CORPORATION JAPAN (JP)
International Classes:
G01R19/00
Foreign References:
| JP2013024800A | 2013-02-04 | |||
| JP2013009514A | 2013-01-10 | |||
| CN103311976A | 2013-09-18 | |||
| US20180149526A1 | 2018-05-31 | |||
| JP2016080364A | 2016-05-16 | |||
| JP2022001987A | 2022-01-06 | |||
| JP2018013415A | 2018-01-25 | |||
| JP2015050870A | 2015-03-16 | |||
| JPS5915865A | 1984-01-26 |
Attorney, Agent or Firm:
NII, Hiromori et al. (JP)
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