Title:
MEMORY CHIP TEST METHOD AND APPARATUS, AND MEDIUM AND DEVICE
Document Type and Number:
WIPO Patent Application WO/2023/245762
Kind Code:
A9
Abstract:
A memory chip test method and apparatus (500), and a medium and an electronic device (600). The memory chip test method comprises: sending a mode register write command to a memory chip, and controlling the memory chip to enter a read-write clock leveling test mode (S110); setting a first preset time, and after waiting for the first preset time, sending a read-write clock signal to the memory chip (S120); determining a predicted value of read-write clock leveling according to the first preset time and a system clock cycle (S130); after sending the read-write clock signal, waiting for a second preset time, then checking a test data output port of the memory chip, and acquiring a test value (S140); and comparing the test value with the predicted value to determine whether the memory chip is abnormal (S150). By means of the method, the product quality can be ensured, data loss caused by read-write errors is avoided, and the test accuracy is improved.
Inventors:
ZHAO BEIYOU (CN)
LI YU (CN)
SHI TENG (CN)
LI YU (CN)
SHI TENG (CN)
Application Number:
PCT/CN2022/105255
Publication Date:
February 29, 2024
Filing Date:
July 12, 2022
Export Citation:
Assignee:
CHANGXIN MEMORY TECH INC (CN)
International Classes:
G11C29/10; G11C29/00
Attorney, Agent or Firm:
BEIJING INTELLEGAL INTELLECTUAL PROPERTY AGENT LTD. (CN)
Download PDF: