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Patent Searching and Data


Title:
METHOD OF ANALYZING MICROPARTICLE COMPOSITION AND MICROPARTICLE COMPOSITION ANALYZING DEVICE
Document Type and Number:
WIPO Patent Application WO/2011/114587
Kind Code:
A1
Abstract:
Provided are a method of analyzing microparticle compositions and a microparticle composition analyzing device which are capable of quantitatively analyzing the mass concentration of air microparticles online for each chemical composition. The particle ray of microparticles in an air sample is converged, and is irradiated onto a narrow domain of a capture body which includes a mesh-shaped structure for capturing the microparticles in the particle ray while removing surplus gas phase components, and thereby the microparticles are captured. Then, the narrow region is subjected to concentrated irradiation of energy rays, and the microparticles that are captured by the capture body are vaporized, sublimated or reacted to yield a desorbed component, which is analyzed. Further, the microparticle composition analyzing device (50) is configured to include at least decompression chambers (11a to 11c); a particle ray generator (1) of microparticles; a capture body (7) including a mesh-shaped structure for capturing the microparticles; an energy supply (5); a holding container (17) for the capture body, a conduit pipe (8) connected to the holding container for the capture body; and an analyzer (10) which analyzes the desorbed component of the microparticles.

Inventors:
TAKEGAWA NOBUYUKI (JP)
NAKAMURA TAKAYUKI (JP)
SAMESHIMA YUUKI (JP)
TAKEI MASAHIKO (JP)
HIRAYAMA NORITOMO (JP)
Application Number:
PCT/JP2010/071818
Publication Date:
September 22, 2011
Filing Date:
December 06, 2010
Export Citation:
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Assignee:
UNIV TOKYO (JP)
FUJI ELECTRIC SYSTEMS CO LTD (JP)
TAKEGAWA NOBUYUKI (JP)
NAKAMURA TAKAYUKI (JP)
SAMESHIMA YUUKI (JP)
TAKEI MASAHIKO (JP)
HIRAYAMA NORITOMO (JP)
International Classes:
G01N1/22; G01N27/62
Foreign References:
JP2000180316A2000-06-30
JP2001351569A2001-12-21
JP2001511257A2001-08-07
JPH07505218A1995-06-08
JP2002506201A2002-02-26
JP2007309878A2007-11-29
JP2004028741A2004-01-29
US5270542A1993-12-14
Other References:
ALLAN J D ET AL.: "Quantitative sampling using an Aerodyne aerosol mass spectrometer 1. Techniques of data interpretation and error analysis.", J GEOPHYS RES, vol. 108, no. D3, 16 February 2003 (2003-02-16), pages AAC1.1 - AAC1.10
ALLAN J D ET AL.: "Quantitative sampling using an Aerodyne aerosol mass spectrometer 2. Measurements of fine particulate chemical composition in two U.K. cities.", J GEOPHYS RES, vol. 108, no. D3, 16 February 2003 (2003-02-16), pages AAC2.1 - AAC2.15, XP008084098, DOI: doi:10.1029/2002JD002359
Attorney, Agent or Firm:
MATSUI SHIGERU (JP)
Shigeru Matsui (JP)
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Claims: