Title:
METHOD AND APPARATUS FOR DETERMINING REPAIR POSITION OF STANDBY CIRCUIT, AND METHOD FOR REPAIRING INTEGRATED CIRCUIT
Document Type and Number:
WIPO Patent Application WO/2022/110858
Kind Code:
A1
Abstract:
A method and apparatus for determining a repair position of a standby circuit, and a method for repairing an integrated circuit. A failure position on a chip to be repaired is determined, and an initial repair position of a standby circuit can be preliminarily assigned according to the failure position; a potential failure line can be determined according to the initial repair position, and a predicted repair position can be then determined according to the potential failure line, wherein the predicted repair position is a position where a new failure position is more likely to occur; and a final repair position of the standby circuit can be then determined according to the failure position and the predicted repair position. Thus, the failure position and the predicted repair position where a new failure position may occur can be both determined as repair positions that need to be repaired, such that the positions are repaired before a new failure position occurs. (Figure 2)
Inventors:
YANG LEI (CN)
CHEN YUI-LANG (CN)
CHEN YUI-LANG (CN)
Application Number:
PCT/CN2021/109067
Publication Date:
June 02, 2022
Filing Date:
July 28, 2021
Export Citation:
Assignee:
CHANGXIN MEMORY TECH INC (CN)
International Classes:
G11C29/00
Foreign References:
| CN101765889A | 2010-06-30 | |||
| CN110991124A | 2020-04-10 | |||
| CN101431618A | 2009-05-13 | |||
| CN102087426A | 2011-06-08 |
Attorney, Agent or Firm:
BEIJING INTELLEGAL INTELLECTUAL PROPERTY AGENT LTD. (CN)
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