Title:
METHOD AND APPARATUS FOR EXAMINING DEFECTS AND DEFORMITIES OF CENTRAL VISUAL FIELD
Document Type and Number:
WIPO Patent Application WO/2023/204517
Kind Code:
A1
Abstract:
The present invention relates to an apparatus and a method for examining defects and deformities of the central visual field. The present invention may comprise: a display on which an examination image divided into a plurality of examination regions by reference lines is shown and in which examination patterns are shown in the examination regions; an input device to which pattern recognition values of an examinee's recognition of the examination patterns are input; and a control device that derives an abnormal region of the examinee on the basis of the pattern recognition values and preset values.
Inventors:
KANG SE WOONG (KR)
KIM YUN TAEK (KR)
KIM YUN TAEK (KR)
Application Number:
PCT/KR2023/004943
Publication Date:
October 26, 2023
Filing Date:
April 12, 2023
Export Citation:
Assignee:
SAMSUNG LIFE PUBLIC WELFARE FOUNDATION (KR)
International Classes:
A61B3/024; A61B3/00; A61B90/00
Foreign References:
| JP2016116542A | 2016-06-30 | |||
| US20160089017A1 | 2016-03-31 | |||
| KR101785255B1 | 2017-10-16 | |||
| KR20180040090A | 2018-04-19 | |||
| JP2012510830A | 2012-05-17 |
Attorney, Agent or Firm:
ISIS IP LAW LLC (KR)
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