Title:
METHOD AND APPARATUS FOR MEASURING AND COLLECTING TEMPERATURE DATA FROM A THERMAL PROCESSOR
Document Type and Number:
WIPO Patent Application WO2001055686
Kind Code:
A9
Abstract:
A method for measuring and collecting temperature data from a thermal processor utilizes a self-contained probe placed in the thermal processor. During the thermal process, temperature data are recorded in a memory. After the probe exits the thermal processor, these data are transmitted by wireless from the memory to a remote data acquisition device. The probe features one or more temperature sensor connections, a memory, a transmitter and a detector for transmitting the contents of the memory in response to a query signal or exit of probe from the thermal process.
Inventors:
KAZMIEROWICZ PHILIP C
Application Number:
PCT/US2001/003282
Publication Date:
October 17, 2002
Filing Date:
January 31, 2001
Export Citation:
Assignee:
KIC THERMAL PROFILING INC (US)
International Classes:
G01K1/02; G01K13/06; (IPC1-7): G01K13/06
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