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Title:
METHOD AND APPARATUS FOR OBTAINING LOGICAL TOPOLOGY INFORMATION OF ODN, DEVICE, AND STORAGE MEDIUM
Document Type and Number:
WIPO Patent Application WO/2020/034900
Kind Code:
A1
Abstract:
The present application provides a method and apparatus for obtaining logical topology information of an ODN, a device, and a storage medium. The method comprises: obtaining identifier information and feature data in a first time window of each first ONU in which an optical path under a first PON port has changed, the feature data comprising at least one of received optical power and an alarm event; obtaining a feature vector corresponding to each first ONU according to the feature data of each first ONU; and performing clustering analysis on the feature vector corresponding to each first ONU to obtain topology information corresponding to the first PON port, the typology information comprising identifier information of at least one group of first ONUs, and the identifier information of each group of first ONUs being used for representing that the first ONUs in the group are mounted to a same non-primary optical splitter. By means of the feature analysis of ONUs, typology information of the ONUs is easily and quickly obtained; in addition, the obtained typology information is accurate, and the typology information of an optical splitter does not need to be maintained by means of manual input.

Inventors:
XIE YUMING (CN)
LI JIAN (CN)
XIAO XIN (CN)
ZHENG GANG (CN)
Application Number:
PCT/CN2019/099926
Publication Date:
February 20, 2020
Filing Date:
August 09, 2019
Export Citation:
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Assignee:
HUAWEI TECH CO LTD (CN)
International Classes:
H04L12/24
Domestic Patent References:
WO2016039670A22016-03-17
Foreign References:
CN103905111A2014-07-02
CN104038375A2014-09-10
CN102204127A2011-09-28
CN106301830A2017-01-04
CN107465966A2017-12-12
Other References:
See also references of EP 3826230A4
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